Specifications: Cu Kα, λ = 1.54 Å Applications: Qualitative and quantitative X-ray structural and
X-ray phase analysis.
Supernova
Single-crystal X-ray Diffractometer "Supernova"
Specifications: Cu (1.54 Å) и Mo (0.71 Å) Applications: Structural characterization of organic and inorganic crystal samples.
Empyrean
Прахов дифрактометър "Empyrean"
Specifications: Cu (1.54 Å) и Co (1.79 Å). Working mode: The device operates in reflection, transmission, microdiffraction, high/low temperature modes, etc. Applications: Qualitative and quantitative analysis; SAXS Microdiffraction, Measurements at different temperatures.
D8Venture
Single-crystal X-ray Diffractometer "D8 Venture"
Specifications: Cu (1.54 Å) и Mo (0.71 Å). Working mode: Апаратът може да работи при ниска температура (до 100К) и при високи налягания (до 1 GPa, Diamond Anvil Cell). Applications: Structural characterization of organic and inorganic crystal samples.