Institute of Mineralogy and Crystallography
"AKAD. IVAN Kostov"

Bulgarian Academy of ScienceS



Scope and Type of analysis
  • Scope

    Investigation of the thermal properties of materials, mineral raw materials and products from their processing.

    Thermogravimetry and Differential Thermal Analysis - TG (DTG) - DTA

    The method of thermal analysis involves the simultaneous recording of changes in sample mass (TG) and differential temperature (DTA), accompanied by changes in the rate of thermal reactions (DTG) for the respective temperature intervals (T) over time.

    1. Purity of substances and the presence of impurities in them;
    2. Thermal behavior of the test sample or series of samples in the programmed mode of operation, including obtaining data on:
    - the temperature intervals of conversion of the different phases of the studied sample;
    - reporting of the intermediate mass losses in the separate stages and the total mass losses at the end of the process;
    - calculation of the dependence dm / dT = f (t) (DTG) and determination of the inflection points of the past reactions;
    3. Temperatures of phase transitions;
    4. Thermal stability of the tested sample;
    5. Mechanism of the thermal behavior of the studied sample;
    6. Kinetic parameters of the process of decomposition of the studied sample;
    7. Phase diagrams;
    8. Comparative characteristics of substances.
  • Differential scanning calorimetry - DSC

    Registration of differences in heat flow as a function of time ΔH = f (t)

    1. Amount of heat released (absorbed) during a process;
    2. Heat of reaction;
    3. Heat of phase transformations.
  • Wave-dispersive x-rays fluorescence spectroscopy - WDXRF

    XRF (X-ray fluorescence) is a non-destructive analytical technique used to determine the elemental composition of materials. The chemical composition of the sample is determined by measuring the fluorescent (or secondary) X-ray emitted by the sample when it is excited by the primary X-ray source. Each of the elements present in the sample produces a set of characteristic fluorescent X-rays ("fingerprint") that is unique to each specific element, making XRF spectroscopy an excellent technology for the qualitative and quantitative analysis of various materials.

    Determination: Elemental analysis of solids, liquids, powders, alloys and thin films from fluorine through uranium (F → U)
  • Education

    Specialized training course for PhD students "Thermal analysis - nature, methods and application" with lecturers
    Prof. Dr. Vilma Petkova, Assoc. Prof. Dr. Nadia Petrova: 20 hours of lectures and 10 hours of practical classes at the Training Center of Bulgarian academy of sciences.

Scientific Equipment
Slide 1
Simultaneus thermal analyzer
"STA 780 - Stanton Redcroft"

Specifications: temperature range 20 - 1500 deg C, heating rate 0.1 - 50 deg/min, sample weight up to 20 mg, gas purge medium - gas/air or static air

Slide 2
Simultaneous thermal analyzer
"Setsys Evolution 2400"

Specification : temperature range 20-2400 deg C; possible heating and cooling rates from 0.1 to 50 deg / min; sample weight up to 20 mg; blowing inert gas/air or static air;
Mode: TGA-DTA + MS (OmniStar)

Slide 3
Wave-dispersive x-ray fluorescence Spectrometer
Rigaku Supermini 200

Specifications: x-ray tube - 50 kV, 200 W Pd-anode; atmosphere - vacuum , primary beam filter - Zr is standard; Al optional; detectors - F-PC and scintillation;
Mode: Elemental analysis of solids, liquids, powders, alloys and thin films from fluorine to uranium (F → U)

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Dept. and Labs
X-ray lab
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