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 Head of Laboratory:

Associate Professor Nadia Petrova, PhD

 Research and academic staff:

Assistant Liliya Tzvetanova, PhD

 XRF (X-ray fluorescence) is a non-destructive analytical technique used to determine the elemental composition of materials. XRF analyzers determine the chemistry of a sample by measuring the fluorescent (or secondary) X-ray emitted from a sample when it is excited by a primary X-ray source. Each of the elements present in a sample produces a set of characteristic fluorescent X-rays ("a fingerprint") that is unique for that specific element, which is why XRF spectroscopy is an excellent technology for qualitative and quantitative analysis of material composition. 

WDXRF (Wave-dispersive x-ray fluorescence) Spectrometer Rigaku Supermini 200

 

Features:

  • Analyze fluorine through uranium (F → U)
  • Analyze: solids, liquids, powders, alloys and thin films
  • Atmosphere: vacuum
  • X-ray tube: 50 kV, 200 W Pd-anode
  • Primary beam filter: Zr is standard; Al optional
  • Detectors: F-PC and scintillation
  • Crystals: 3-position changer
  • Autosampler: 12-position standard
  • Vacuum: rotary pump standard
  • Power: 100 – 120V (50/60 Hz) 15A or 200 – 240V (50/60 Hz) 10A